کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1790435 | 1524431 | 2014 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
LPE growth and characterization of InAs1−xNx films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: LPE growth and characterization of InAs1−xNx films LPE growth and characterization of InAs1−xNx films](/preview/png/1790435.png)
چکیده انگلیسی
• InAs1−xNx films were grown on InAs substrates by liquid phase epitaxy.
• One third of InN powder is placed under the initial melt homogeneously.
• The N content of InAs1−xNx film is up to 0.66%.
A series of InAs1−xNx films have been successfully grown on (100) oriented InAs substrates by liquid phase epitaxy technique. Samples with different nitrogen contents have been analyzed by high-resolution x-ray diffraction measurement, which confirms the incorporation of N in the epilayers. N-related modes are detected in the Raman spectra of InAs1−xNx epilayers. The fundamental absorption edges of InAs1−xNx films obtained by Fourier transform infrared transmission spectroscopy exhibit a red-shift compared with that of InAs homoepilayer.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 398, 15 July 2014, Pages 1–4
Journal: Journal of Crystal Growth - Volume 398, 15 July 2014, Pages 1–4
نویسندگان
Y.F. Lv, S.H. Hu, X.Y. Yang, Y. Wang, C.H. Sun, F. Qiu, R. Cong, W.J. Dong, Y. Zhang, G.L. Yu, N. Dai,