Evaluation of CdTexSe1−x crystals grown from a Te-rich solution

• CdTeSe grown by the Traveling Heater Method.
• Low concentration of sub-grain boundaries.
• Absence of sub-grain boundary network.

We characterized the structural quality of CdTexSe1−x crystals grown by the Traveling Heater Method (THM) from a Te-rich solution using Synchrotron White Beam X-ray Diffraction Topography in the reflection mode. Structural defects were also studied by chemical etching of the crystal surfaces. The crystals were found to be fairly free from strains, and they had very few sub-grain boundaries and dislocation/sub-grain boundary networks.