کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1795532 | 1524482 | 2008 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
In situ observation of composition profiles in the solution by X-ray penetration method
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The X-ray penetration intensity during the diffusion process of NH4Br into H2O was measured by a CdTe line sensor as a function of time and it was converted to the NH4Br composition using a calibration line. The diffusion coefficient of NH4Br into H2O was estimated to be 2.2Ã10â5Â cm2/s by comparing the calculated results. The method was applied to the growth of InGaSb from the In-Ga-Sb solution. The indium composition profiles in the solution were measured and growth of InGaSb from the In-Ga-Sb solution was observed from the change of X-ray intensity. The growth region of InGaSb crystal was confirmed by the electron probe microanalysis. It was demonstrated that the X-ray penetration method was a powerful method to measure the composition profiles in the solution.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 310, Issues 7â9, April 2008, Pages 1487-1492
Journal: Journal of Crystal Growth - Volume 310, Issues 7â9, April 2008, Pages 1487-1492
نویسندگان
Yasuhiro Hayakawa, Takuya Hikida, Hisashi Morii, Akiko Konno, Chung-Hao Chen, Kouji Arafune, Hideki Kawai, Tadanobu Koyama, Yoshimi Momose, Tetsuo Ozawa, Toru Aoki,