Correlation between the mechanical and magneto-transport properties of cobalt film on semiconducting substrate

We have investigated the mechanical and magneto-transport properties of electron beam evaporated Co film on p-Si(1 0 0) substrate. Real time intrinsic stress measurement of the Co film, measured using a cantilever beam technique, shows the evolution of a large tensile stress with the growth of the film on the Si substrate. The analysis of stress reveals a columnar type Volmer–Weber growth which is also confirmed by the atomic force microscopy (AFM) measurements. The Co-film shows high positive (negative) magnetoresistance at all temperatures (below 10 K) on application of out-of-plane (in-plane) magnetic field.