کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1810599 | 1025566 | 2012 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Conduction mechanism and the dielectric relaxation process of a-Se75Te25âxGax (x=0, 5, 10 and 15 at wt%) chalcogenide glasses
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Conduction mechanism and the dielectric relaxation process of a-Se75Te25âxGax (x=0, 5, 10 and 15 at wt%) chalcogenide glasses Conduction mechanism and the dielectric relaxation process of a-Se75Te25âxGax (x=0, 5, 10 and 15 at wt%) chalcogenide glasses](/preview/png/1810599.png)
چکیده انگلیسی
Se75Te25âxGax (x=0, 5, 10 and 15 at wt%) chalcogenide compositions were prepared by the well known melt quenching technique. Thin films with different thicknesses in the range (185-630 nm) of the obtained compositions were deposited by thermal evaporation technique. X-ray diffraction patterns indicate that the amorphous nature of the obtained films. The ac conductivity and the dielectric properties of the studied films have been investigated in the frequency range (102-105 Hz) and in the temperature range (293-333 K). The ac conductivity was found to obey the power low Ïs where sâ¤1 independent of film thickness. The temperature dependence of both ac conductivity and the exponent s can be well interpreted by the correlated barrier hopping (CBH) model. The experimental results of the dielectric constant ε1 and dielectric loss ε2 are frequency and temperature dependent. The maximum barrier height Wm calculated from the results of the dielectric loss according to the Guintini equation, and agrees with that proposed by the theory of hopping of charge carriers over a potential barrier as suggested by Elliott for chalcogenide glasses. The density of localized state was estimated for the studied film compositions. The variation of the studied properties with Ga content was also investigated. The correlation between the ac conduction and the dielectric properties were verified.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica B: Condensed Matter - Volume 407, Issue 13, 1 July 2012, Pages 2476-2485
Journal: Physica B: Condensed Matter - Volume 407, Issue 13, 1 July 2012, Pages 2476-2485
نویسندگان
I.S. Yahia, N.A. Hegab, A.M. Shakra, A.M. AL-Ribaty,