Microwave dielectric properties of the system Ba1−xSrxTiO3

In this work we present dielectric permittivity for the system Ba1−xSrxTiO3, with 0≤x≤1, at 2.7 GHz. The measurements were made using the small perturbation method, where resonance frequency and the quality factor of a cavity, with and without the sample, were used to calculate the complex dielectric permittivity, ε*=ε′−iε″, of the material.