Dielectric relaxation study on Ce0.9Gd0.1O1.95Ce0.9Gd0.1O1.95 ceramics

Dielectric relaxation measurements for Ce0.9Gd0.1O1.95Ce0.9Gd0.1O1.95 ceramics have revealed the electric transport properties for the bulk and grain boundary components. A jump frequency obtained from the dielectric relaxation corresponds to a lattice frequency in the bulk component, and the relaxation shows a remarkable difference of the jump frequency rather than the activation energy between the bulk and grain boundary components. Diffusion of oxygen vacancies due to the lattice frequency in the bulk and appearance of an excess resistance due to the discontinuous jump frequency in the grain boundary are discussed.