Effect of seed layer on biaxial texturing of pulsed laser deposited YSZ films on electrodeposited Ir/Ni–W tapes

Pulsed laser deposition (PLD) of biaxially textured Y2O3 stabilized ZrO2 (YSZ) layers on electrodeposited Ir/Ni–W tape is reported. Biaxial texturing is obtained by deposition of an YSZ seed layer at 800 °C in 10−6 Torr vacuum. X-ray diffraction (XRD) studies of θ–2θ and pole figures confirmed in-plane, out-of-plane biaxial texturing with Δϕ = 8° and Δω = 7.9°. Atomic force microscopy (AFM) revealed a surface with roughness of about 3 nm.