Analyzing Cd underpotential deposition behavior on Se thin-films: Atomic force microscopy, cyclic voltammetry and electrochemical quartz crystal nanobalance studies

Cd UPD on selenium was studied for an Au-EQCN modified electrode with Se thin-films previously deposited in acid media. The relationship between AFM, cyclic voltammetry and EQCN data provided an analysis of Cd UPD on a semiconductive layer. EQCN measurements demonstrated that the increase of mass during the potentiostatic deposition in UPD conditions was larger than expected for the maximum recovery allowed (i.e. 0.17 ML), which was related to diffusion through the Se thin-film. From AFM data it was possible to normalize voltammetric and gravimetric data, and our results were consistent with a controlled electrodeposition of CdSe structures. The result of the Cd UPD process was a controlled amount of CdSe. In addition, these findings also demonstrated that electrodeposition in UPD conditions can be used as a helpful technique in order to improve control in surface engineering.