A study on molybdenum sulphoselenide (MoSxSe2−x, 0 ≤ x ≤ 2) thin films: Growth from solution and its properties

Thin films of molybdenum sulphoselenide, MoSxSe2−x, (0 ≤ x ≤ 2) have been electrosynthesized on indium-tin-oxide (ITO)-coated glass and stainless steel substrates. The films were characterized for their structural, morphological and compositional characteristics. Their optical and semiconducting parameters were also analysed in order to determine the suitability of the thin films for photoelectrochemical (PEC)/solar cell applications. Structural analysis via X-ray diffraction (XRD) analysis reveals that the films are polycrystalline in nature. Scanning electron microscope (SEM) studies reveals the films were adherent to the substrate with uniform in nature which also confirmed by Transmission electron microscope (TEM). Compositional analysis via energy dispersive X-ray (EDX) technique confirms the presence of Mo, S and Se elements in the films. The optical studies show that the films are of direct bandgap. Results on the semiconductor parameters analysis of the films showed that the nature of the Mott–Schottky plots indicates that the films obtained are of n-type material. For all films, the semiconductor parameter values come in the better range of other transition metal chalcogenides which has proven that MoSSe thin films are capable as solar/PEC cell materials.

► Effect of deposition time on the properties of molybdenum chalcogenide thin films.
► First time to compare the study of binary and ternary molybdenum chalcogenides.
► No previous report on ternary molybdenum sulphoselenide by electrodeposition.
► Semiconducting parameters by CV analysis promising to be good solar cell material.