کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
190661 459703 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Mesoscopic impedance analysis of solid materials’ surface
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی مهندسی شیمی (عمومی)
پیش نمایش صفحه اول مقاله
Mesoscopic impedance analysis of solid materials’ surface
چکیده انگلیسی

Several techniques have been developed in order to characterize electrical properties of surfaces in micrometer/nanometer scale. Obtaining of the spatial distribution of sample resistance, capacitance or potential requires separate measurements performed in different scanning modes. On the other hand, analysis of the frequency response of investigated system enables determination of several physical quantities in single measurement cycle. In this paper authors discuss possibility of obtaining the spatial impedance characteristic by means of built-in capabilities of the AFM device. Factors influencing the measurements and shortcomings of the proposed methodology are discussed together with postulated solutions.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Electrochimica Acta - Volume 55, Issue 26, 1 November 2010, Pages 7761–7765
نویسندگان
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