کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
196637 | 459847 | 2006 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
On the dependence of the Nernst diffusion layer thickness on potential and sweep rate for reversible and of the thickness of the charge transfer layer for irreversible processes studied by application of the linear potential sweep method
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
مهندسی شیمی (عمومی)
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چکیده انگلیسی
In this paper, a discussion is made of the dependence between the diffusion layer thickness and the potential sweep rate and the potential value for reversible charge transfer processes studied under the application of a linear potential sweep. Also the equivalent circuit for that type of processes is remembered as well as the concept of conductance. The same concepts are discussed for the case of irreversible charge transfer processes studied also by linear potential sweep voltammetry. A consideration is made of the concept of general conductance as utilised in electrochemical processes and the results of its utilisation are compared with those obtained by using the physical definition of conductance and discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Electrochimica Acta - Volume 51, Issue 14, 15 March 2006, Pages 2971–2976
Journal: Electrochimica Acta - Volume 51, Issue 14, 15 March 2006, Pages 2971–2976
نویسندگان
Jaime González Velasco,