کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5006126 | 1461384 | 2017 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The surface morphology, structural properties and chemical composition of Cd1âxZnxTe polycrystalline thick films deposited by close spaced vacuum sublimation
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Thick polycrystalline Cd1âxZnxTe films with x ranged from 0.37 to 0.80 were obtained by the close spaced vacuum sublimation method. In order to investigate properties of the films structural, PIXE and Raman studies were carried out. Determination of chemical composition of the films by EDS, PIXE and XRD has shown good correlation of results. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Studies of the spatial distribution of the chemical elements on the film surface by micro-PIXE and micro-Raman spectroscopy have shown that films are uniform and free of secondary phases such as CdTe, ZnTe and Te inclusions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science in Semiconductor Processing - Volume 63, 1 June 2017, Pages 64-71
Journal: Materials Science in Semiconductor Processing - Volume 63, 1 June 2017, Pages 64-71
نویسندگان
Y.V. Znamenshchykov, V.V. Kosyak, A.S. Opanasyuk, E. Dauksta, A.A. Ponomarov, A.V. Romanenko, A.S. Stanislavov, A. Medvids, I.O. Shpetnyi, Yu.I. Gorobets,