Impedance and dielectric analysis of polycrystalline undoped and Fe doped SnS2

Polycrystalline Sn1−xFexS2 samples with (x=0, 0.125, 0.250 and 0.375) have been prepared by the molten salt solid state reaction method. The X-ray diffraction (XRD) shows that all the samples crystallize in the hexagonal structure, with P-3m1 space group in preferred orientation of (011). The electrical properties have been studied by complex impedance spectroscopy over the frequency range (20 Hz up to 1 MHz) at room temperature. The Nyquist plot for all samples have been fitted using ZMAN software. The impedance analysis showed that all samples exhibit both bulk and grain boundary contributions and it was found that by increasing the iron content, the resistance increases, but, the dielectric constant and dielectric loss tangent decrease which leads to decrease in conduction. The absorption coefficient (α) has been calculated from the complex dielectric constant. Interestingly, there was a significant correlation between the electromagnetic wave absorption and the reduction in the peak intensity of the XRD patterns indicating that when the iron content increases the sample seems to be a good absorber of electromagnetic waves.