Temperature-induced transition of the diffusion mechanism of n-hexane in ultra-thin polystyrene films, resolved by in-situ Spectroscopic Ellipsometry

Temperature-induced transition of the diffusion mechanism of n-hexane in ultra-thin polystyrene films, resolved by in-situ Spectroscopic Ellipsometry

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Polymer - Volume 54, Issue 1, 8 January 2013, Pages 341-348

Wojciech Ogieglo, Herbert Wormeester, Matthias Wessling, Nieck E. Benes,