کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5395520 | 1505721 | 2016 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Design concept of the high-resolution end-station PEAXIS at BESSY II: Wide-Q-range RIXS and XPS measurements on solids, solutions, and interfaces
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Design concept of the high-resolution end-station PEAXIS at BESSY II: Wide-Q-range RIXS and XPS measurements on solids, solutions, and interfaces Design concept of the high-resolution end-station PEAXIS at BESSY II: Wide-Q-range RIXS and XPS measurements on solids, solutions, and interfaces](/preview/png/5395520.png)
چکیده انگلیسی
Besides the description of this end-station, a systematic way is shown for the design of a RIXS instrument assessing the grating parameters based on existing theories and for the calculation of optimal instrument settings as a function of photon energy. Different grating inclinations, line densities, groove shapes and RIXS instrument lengths were investigated. Possible parameter combinations were calculated analytically and the resulting instrument performance was determined by ray-tracing simulations using the simulation package RAY. The performance of the RIXS instrument was evaluated by choosing the product of the intensity at the detector and the square of the resolving power as figure of merit to optimize the spectrometer. The robustness of the optimized parameters has been checked in order to define tolerance parameters for the engineering design of the spectrometer.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 210, July 2016, Pages 54-65
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 210, July 2016, Pages 54-65
نویسندگان
Klaus Lieutenant, Tommy Hofmann, Christian Schulz, Mikhail V. Yablonskikh, Klaus Habicht, Emad F. Aziz,