کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5395961 | 1505735 | 2014 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterising ultrathin ceria films at the nanoscale: Combining spectroscopy and microscopy
ترجمه فارسی عنوان
ویژگی های فیلم های سریم ساندویچ نانومقیاس: ترکیبی از طیف سنجی و میکروسکوپ
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
چکیده انگلیسی
CeO2âx(1Â 1Â 1) ultrathin films consisting of small, discrete islands decorating a Pt(1Â 1Â 1) substrate have been studied using a combination of Scanning Tunnelling Microscopy, Low-Energy Electron Microscopy, and Low-Energy Electron Diffraction. Significantly, the chemical nature of the ceria film has also been probed using X-ray Absorption Spectroscopy (XAS) combined with X-ray PhotoEmission Electron Microscopy (XPEEM) in the same ultrahigh vacuum system. XAS spectra over the Ce M5 absorption edge demonstrated that the ceria islands contained â¼50% Ce4+and â¼50% Ce3+, leading to an overall stoichiometry of CeO1.75, which was uniform across the film. The unique advantage of this experimental setup is the application of multiple techniques on the same sample: high-resolution STM to monitor the morphology, XPEEM to probe the stoichiometry, and LEEM to act as a bridge between the two.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 195, August 2014, Pages 13-17
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 195, August 2014, Pages 13-17
نویسندگان
David C. Grinter, Chi L. Pang, Christopher A. Muryn, Francesco Maccherozzi, Sarnjeet S. Dhesi, Geoff Thornton,