کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5396044 1505740 2013 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8
چکیده انگلیسی
In this study, we have realized a high lateral resolution and wide-angle-resolved hard X-ray photoelectron spectroscopy (HAXPES) facility at BL47XU in SPring-8. The system uses Kirkpatrick-Baez focusing mirrors to achieve a beam size of 1.0 μm (horizontal) × 0.98 μm (vertical) at the photon energy of 7.94 keV and a wide-acceptance-angle objective lens installed in front of the electron energy analyzer. The objective lens system, which we had been developed originally and has achieved a total acceptance angle of ±34° with a resolution better than that of an acceptance angle of 1.5°. The performance of this system was evaluated through core spectra measurements of a typical multi-layered sample of Ir (8 nm)/HfO2 (2.2 nm)/thickness-graded SiO2 (0-10 nm)/Si(0 0 1).
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 190, Part B, October 2013, Pages 180-187
نویسندگان
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