کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396044 | 1505740 | 2013 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8
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موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8 Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8](/preview/png/5396044.png)
چکیده انگلیسی
In this study, we have realized a high lateral resolution and wide-angle-resolved hard X-ray photoelectron spectroscopy (HAXPES) facility at BL47XU in SPring-8. The system uses Kirkpatrick-Baez focusing mirrors to achieve a beam size of 1.0 μm (horizontal) Ã 0.98 μm (vertical) at the photon energy of 7.94 keV and a wide-acceptance-angle objective lens installed in front of the electron energy analyzer. The objective lens system, which we had been developed originally and has achieved a total acceptance angle of ±34° with a resolution better than that of an acceptance angle of 1.5°. The performance of this system was evaluated through core spectra measurements of a typical multi-layered sample of Ir (8 nm)/HfO2 (2.2 nm)/thickness-graded SiO2 (0-10 nm)/Si(0 0 1).
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 190, Part B, October 2013, Pages 180-187
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 190, Part B, October 2013, Pages 180-187
نویسندگان
Eiji Ikenaga, Masaaki Kobata, Hiroyuki Matsuda, Takeharu Sugiyama, Hiroshi Daimon, Keisuke Kobayashi,