Photodetachment electron flux of H− in combined electric and magnetic fields with arbitrary orientation

On the basis of the semi-classical theory, we calculate the photodetachment electron flux of H− in combined electric field and magnetic field with arbitrary orientation. Our results suggest that the electron flux distributions on the detector plane is not only related to the angle between the electric and magnetic fields, but also related to the electron energy. With the increase of the angle between the electric and magnetic field, the oscillating region in the electron flux distributions becomes smaller. In addition, we find with the increase of the detached electron's energy, the oscillating structure in the flux distributions becomes much more complicated. Therefore, the oscillation in the detached electron flux distributions can be controlled by adjusting the angle between the electric and magnetic field and the detached electron's energy. We hope that our studies may guide the future experimental researches in the photodetachment microscopy of negative ion in the presence of external fields.