Angle-resolved X-ray photoemission electron microscopy

► Microprobe ARPES is successfully applied to studies on graphene. ► We propose a novel approach by applying dark field methods to XPEEM. ► The lateral resolution in dark field XPEEM is better than 40 nm. ► Dark field XPEEM is applied to O/W(1 1 0) to determine adsorption site symmetry.