The interplay of topography and energy dissipation in pentacene thin films

► We observe a lifetime contrast in time-resolved photoemission electron microscopy for thin pentacene films on Si(0 0 1) and (√3 × √3)-Ag/Si(1 1 1). ► Depending on the morphology of the sample the observed lifetime varies by a factor of two. ► This difference can be explained by the electronic coupling of the pentacene layers to the substrate.