کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396600 | 1505760 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
High resolution in EXAFS data analysis of multilayer nanostuctures
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: High resolution in EXAFS data analysis of multilayer nanostuctures High resolution in EXAFS data analysis of multilayer nanostuctures](/preview/png/5396600.png)
چکیده انگلیسی
The regularization method of solving ill-posed problem is used to determine three partial interatomic distances from one EXAFS spectrum. The mathematical procedure and the experimental results of the EXAFS analysis for multilayer FeNi/V nanostructures are discussed. The measurements were performed using ESRF facilities (BM line 26A, Grenoble, France). The Fe, Ni and V edge absorption spectra were recorded in fluorescence and transmission modes at room temperature for foils Fe, Ni, V and for multilayer nanostructures [Fe82Ni18(5ML)/V(6ML)]25, [Fe82Ni18(10ML)/V(6ML)]25, films Fe82Ni18, Fe, Ni, V (1000Â Ã
thickness) in fluorescence mode only. All film samples were prepared at University Uppsala (Sweden). Peculiar features of the method are high resolution for overlapping in r-space shells and high accuracy in the determination of partial interatomic distances.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 175, Issues 1â3, December 2009, Pages 27-30
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 175, Issues 1â3, December 2009, Pages 27-30
نویسندگان
Yu.A. Babanov, Yu.A. Salamatov, I.Yu. Kamensky, A.V. Ryazhkin, V.V. Ustinov,