کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396641 | 1505757 | 2010 | 26 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging](/preview/png/5396641.png)
چکیده انگلیسی
Models for energy loss in XPS are reviewed. We start with rigorous models to describe the fundamental interaction of the electric fields from both the core-hole and the moving electron with the many-electron system of the solid and including also the influence of the surface and the interaction that takes place while the photoelectron moves in the vacuum. We then discuss the development of progressively simpler descriptions where different aspects of the rigorous model are treated approximately or ignored. These descriptions are less accurate but much more useful for practical data analysis. Applications for nano-scale quantification, non-destructive depth profiling and 3D imaging are discussed. The accuracy of the theory is in all parts validated by comparison to experiments.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 178â179, May 2010, Pages 128-153
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 178â179, May 2010, Pages 128-153
نویسندگان
Sven Tougaard,