کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5396647 1505757 2010 17 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
X-ray photoelectron spectroscopy using hard X-rays
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
X-ray photoelectron spectroscopy using hard X-rays
چکیده انگلیسی
Hard X-ray photoelectron spectroscopy (HAXPES or HXPS), using hard (2-15 keV) X-rays for excitation and high energy resolution, has shown a spectacular development recently, due to its capability for providing an insight into the bulk electronic structure of solids and the chemical composition of buried layers and interfaces lying at depths of several tens of nm. Following a summary of fundamentals concerning photoionization phenomena and transport processes of photoelectrons induced by hard X-rays from solids, examples of core level and valence band HAXPES spectra are presented to illustrate different physical effects. Examples are given of applications of HAXPES in determining electronic structure properties and in surface/interface chemical analysis of material systems of high practical interest. Finally, some perspectives for further developments are outlined.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 178–179, May 2010, Pages 241-257
نویسندگان
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