کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396647 | 1505757 | 2010 | 17 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
X-ray photoelectron spectroscopy using hard X-rays
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Hard X-ray photoelectron spectroscopy (HAXPES or HXPS), using hard (2-15Â keV) X-rays for excitation and high energy resolution, has shown a spectacular development recently, due to its capability for providing an insight into the bulk electronic structure of solids and the chemical composition of buried layers and interfaces lying at depths of several tens of nm. Following a summary of fundamentals concerning photoionization phenomena and transport processes of photoelectrons induced by hard X-rays from solids, examples of core level and valence band HAXPES spectra are presented to illustrate different physical effects. Examples are given of applications of HAXPES in determining electronic structure properties and in surface/interface chemical analysis of material systems of high practical interest. Finally, some perspectives for further developments are outlined.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 178â179, May 2010, Pages 241-257
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 178â179, May 2010, Pages 241-257
نویسندگان
László Kövér,