Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations

By now, these time-of-flight analysis instruments achieve intrinsic time resolutions of 108 ps absolute and 13.5 ps relative. Very high permanent measurement speeds of more than 4 million events per second in random detection regimes have been realized using a standard USB2.0 interface. By means of this performance, the time-resolved PEEM technique enables to display evolutions of spatially resolved (<25 nm) and temporal sliced images life on any modern computer. The method allows dynamics investigations of variable electrical, magnetic, and optical near fields at surfaces and great prospects in dynamical adaptive photoelectron optics. For dynamical processes in the ps time scale such as magnetic domain wall movements, the time resolution of the delay line detectors even allows to be used directly for real-time experiments as well.