Fringing field correction of the second-order angular aberration in sector field electron energy analyzers

A new way of correcting the second-order angular aberration in sector field and polar-toroidal electron energy analyzers with object and image located outside the field is proposed. Correction is performed by biasing the optic axis electrostatic potential inside the analyzer with respect to the potential of surrounding field-free space. The strength of the correcting aberration concentrated in the fringing field regions of the analyzer is calculated with the aid of the fringing field integral method. The described correction allows achieving second-order focusing and thus increasing the energy resolving power in sector field analyzers, in particular used for angle resolved energy measurements.