کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396893 | 1505771 | 2008 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Negative ion formation from photoexcited carbon tetrachloride and silicon tetrachloride studied by negative-ion mass spectrometry in the range of 12.4-31.0Â eV
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Negative ion formation from photoexcited carbon tetrachloride (CCl4) and silicon tetrachloride (SiCl4) has been investigated by negative-ion mass spectrometry using synchrotron radiation in the energy range of 12.4-31.0Â eV. Only Clâ anions are detected in a negative ion mass spectrometer. Negative ion yields for the Clâ anion were measured in terms of the photon energy. We observe a variety of photochemical processes relevant to the electronic states of the molecules. Assignments of peaks were made on the basis of the thermochemical data and fragment ion appearance energy reported previously. The onset at â¼14.9Â eV in the negative ion yield curve of CCl4 presumably corresponds to the Rydberg state (converging to the CË,T22 limit) giving rise to consecutive fragmentation of photoexcited CCl4 leading to CCl2++Clâ+Cl. Similarly, the onset at â¼15.9Â eV in SiCl4 presumably corresponds to the Rydberg states (converging to the DË,A21 limit) leading to the ion-pair formation mainly involving SiCl2++Clâ+Cl.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 163, Issues 1â3, April 2008, Pages 40-44
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 163, Issues 1â3, April 2008, Pages 40-44
نویسندگان
Bong Hyun Boo, Inosuke Koyano,