کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5396947 | 1505772 | 2007 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Auger-photoelectron coincidence spectroscopy of SiO2
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The O K-LL spectrum from a SiO2 surface was measured in coincidence with O 1s photoemission in SiO2. The coincidence lineshapes are compared to the simultaneously obtained conventional Auger lineshapes and to model lineshapes. The low-energy tail of the O K-LL lineshape from SiO2 is suppressed in the APECS spectrum due to discrimination against extrinsic loss and initial-state shake processes, but remaining intensity indicated significant contribution from final-state shake-up/off processes. The results also confirm that a low energy satellite to the O K-L2,3L2,3 Auger line that is eliminated in the coincidence spectrum, and a high-energy shoulder that is enhanced in the coincidence spectrum, arise from an initial-state shake process, and final-state correlation effects, respectively. The results demonstrate the viability of applying APECS to the study of other metal oxides via the anion.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 161, Issues 1â3, October 2007, Pages 150-159
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 161, Issues 1â3, October 2007, Pages 150-159
نویسندگان
G.A. van Riessen, S.M. Thurgate, D.E. Ramaker,