کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5399640 1505901 2015 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Evaluation of defects in cuprous oxide through exciton luminescence imaging
ترجمه فارسی عنوان
بررسی نقایص در اکسید مس از طریق تصویربرداری لنزهای اکسیتون
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
چکیده انگلیسی
The various decay mechanisms of excitons in cuprous oxide (Cu2O) are highly sensitive to defects which can relax selection rules. Here we report cryogenic hyperspectral imaging of exciton luminescence from cuprous oxide crystals grown via the floating zone method showing that the samples have few defects. Some locations, however, show strain splitting of the 1s orthoexciton triplet polariton luminescence. Strain is reduced by annealing. In addition, annealing causes annihilation of oxygen and copper vacancies, which leads to a negative correlation between luminescence of unlike vacancies.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Luminescence - Volume 159, March 2015, Pages 294-302
نویسندگان
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