کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5403818 1392768 2008 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Trapping mechanism in the afterglow process of the rare-earth activated Y2O2S phosphors
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Trapping mechanism in the afterglow process of the rare-earth activated Y2O2S phosphors
چکیده انگلیسی
It is concluded that the excited electron and the hole in the conduction and valence bands are trapped separately in the states (impurity levels) located in the vicinity of the Ln3+ ion. The trapping depths of the level range from 0.3 to 1.1 eV and are dependent on the electron affinity of the Ln3+ ion estimated from the energy difference between the 4fn+1 and the 4fn configurations in the 4f shell of the ion.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Luminescence - Volume 128, Issue 3, March 2008, Pages 494-498
نویسندگان
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