کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
540587 871329 2010 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Effects of Ar and O2 additives on photopatternable sol–gel etching in an SF6-based plasma for planar lightwave circuit fabrication
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Effects of Ar and O2 additives on photopatternable sol–gel etching in an SF6-based plasma for planar lightwave circuit fabrication
چکیده انگلیسی

We present a novel study of the interaction of SF6-based plasmas with sol–gel materials in a parallel plate reactive ion etching (RIE) system. The purpose of these experiments was to obtain quantitative measures and optimisation of the RIE parameters, which can be used in the microfabrication of planar lightwave circuit (PLC) devices. The sulfur hexafluoride chemistry is chosen due to its excellent etching properties of SiO2, which is one of the components of the photopatternable sol–gel materials and is not present in typical photoresist materials. Fast process etching rate and good selectivity is achieved by varying SF6 flow and power delivered to the electrodes. The study also reveals a marginal influence of oxygen and argon flow on the character of the sol–gel etching. The experimental data obtained can be used as a reference for any sol–gel devices fabricated using widely available RIE reactors.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 87, Issue 11, November 2010, Pages 2071–2076
نویسندگان
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