کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
540800 871344 2007 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Low temperature RTP for BCB curing
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Low temperature RTP for BCB curing
چکیده انگلیسی

Rapid thermal processing (RTP) applications are rapidly expanding from the original processes, typically performed above 1000 °C (e.g., post-implant annealing and silicon oxidation) to lower temperature applications such as cobalt and nickel silicide formation with process steps performed as low as 200 °C. The original lamp-based (i.e., “cold wall”) RTP systems, despite their pyrometry-related issues, are [1] still used, even in this low temperature regime. Another problem related to this approach occurs when processing materials exhibit significant outgassing, such as boron-phosphosilicate glass (BPSG). The outgassed vapour can condense on the cold chamber walls and change the light transmission characteristics of the quartz window. This can cause a process shift, uniformity change and will likely increase maintenance. In this paper, an alternative, hot wall approach, based on convection and conductive heat transfer is evaluated for low-temperature curing and annealing of benzocyclobutene (BCB) for high speed digital and microwave applications [2].

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 84, Issue 11, November 2007, Pages 2646–2652
نویسندگان
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