X-ray diffraction studies of the Ni-Si and Al-Ni-Si melts

The local atomic structure of the liquid Ni-Si and Al-Ni-Si alloys has been studied by X-ray diffraction and Reverse Monte Carlo simulations. The chemical short-range order and disordered close packing in the liquid binary and ternary alloys have been discussed. A method of calculating the X-ray scattering curve (I(Q)) of a ternary melt based on I(Q) of boundary binary melts was proposed and tested. The phase and microstructure analyses of the melt-spun and annealed Al70Ni10Si20 ribbons were performed.