کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
541681 871484 2008 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Work function control at metal high-dielectric-constant gate oxide interfaces
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Work function control at metal high-dielectric-constant gate oxide interfaces
چکیده انگلیسی

There has been difficulty in finding metals of sufficiently large or small effective work function to act as metal electrodes on high-dielectric-constant gate oxides. To understand the factors affecting the effective work function, we have calculated the Schottky barrier heights (SBH) of a range of metals at different configurations on (1 0 0) and (1 1 0) HfO2 surfaces. On (1 0 0) surfaces, different O-terminations are found to be able to shift the SBH by up to 1 eV. Metals of different work function from Y to Ni are found to be able to shift the SBH by over 1 eV. This is a key conclusion which contrasts with the ‘Fermi level pinning’ on HfO2 found by some groups. On the non-polar (1 1 0) surface, the low work function metals like Al and Hf are found to bond to O sites, whereas high work function metals like Ni can bond to both Hf and O sites. Thus, many factors such a termination and stoichiometry control the SBH and the effective work function of a metal.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 85, Issue 1, January 2008, Pages 9–14
نویسندگان
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