The microstructure, ferroelectric and dielectric behaviors of BiFeO3-Na0.5Bi0.5TiO3 based solid solution thin films

BiFe0.98Zn0.02O3-Na0.5Bi0.5Ti0.98W0.02O3 solid solution thin films with two thicknesses (300 nm and 1.2 μm) were fabricated on indium tin oxide/glass substrates via metal organic decomposition. The effects of the thickness on crystallization, microstructure morphology, ferroelectric and dielectric properties were investigated. Compared with the 300-nm-thick film, 1.2 μm- film exhibits standard ferroelectric hysteresis loop with slim feature and larger dielectric constant due to the improvements of crystallinity and insulating property. Moreover, obvious aging behavior, manifested by pinched-like ferroelectric hysteresis loop and abnormal butterfly dielectric constant-electric field curve, can be observed in the film with 1.2 μm thickness. The aging behavior can be explained by the formation of the defect complex.