کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
544238 1450371 2013 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Control of self-assembly defects in thermal nanoimprint
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Control of self-assembly defects in thermal nanoimprint
چکیده انگلیسی

With residual-free imprint, physical self-assembly of the polymer within partly-filled cavities has to be avoided to ensure the masking capability of nanoimprint when used as a lithography technique. In this regard we investigate the impact of the velocity of pressure application by use of a motor-driven imprint system. Slowing-down the velocity of pressure application maintains a smooth surface of the polymeric layer in the cavities, minimizing the risk of local contact between polymer and stamp with moderate filling levels of the cavities. At a high filling level of the cavities, the formation of self-assembly cannot be avoided, as van der Waals interactions between polymer surface and stamp become effective to drive the formation of instabilities. The experimental results obtained can be understood by stability analysis. Understanding of the processes leading to the formation of physical self-assembly is vital to exploit the full potential of nanoimprint for processing.

Figure optionsDownload as PowerPoint slideHighlights
► Control of physical self-assembly by the intrusion velocity of the stamp.
► Slow imprint smoothens polymer surface.
► Instability analysis including stamp height.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 110, October 2013, Pages 80–84
نویسندگان
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