کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5489328 1524354 2017 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Invariance of multifractal spectrums of spatial forms on the surface of ZnxCd1-xTe - Si heterocompositions synthesized by electron beam epitaxy and hot wall epitaxy
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
Invariance of multifractal spectrums of spatial forms on the surface of ZnxCd1-xTe - Si heterocompositions synthesized by electron beam epitaxy and hot wall epitaxy
چکیده انگلیسی


- Surface of the ZnXCd1-XTe layers grown by the electron beam epitaxy and the hot wall epitaxy.
- Multifractal analysis of surface nanoforms formed the surface relief of the ZnXCd1-XTe layers.
- Comparison of MF spectrums of the layer surfaces obtained by different technologies.

Multifractal (MF) analysis is applied for the description of spatial nanoforms which form a relief on a surface of heterostructures of ZnxCd1-xTe solid solution - substrate Si (1 1 1) synthesized by the method of the electron beam with the evaporating anode. The input data for the MF analysis were the AFM (atomic force microscopy) images of the surface of layers. Comparison of parameters of MF spectrums for different geometries of the surface relief of the layers obtained at identical temperatures and approximately identical growth rates by the above mentioned method of growth and the method of hot wall epitaxy has been performed.It was shown that within the error limits, MF spectrums of spatial nanoforms for heterostructures ZnxCd1-xTe - Si remained very similar under identical conditions for synthesis of layers for compared techniques.

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ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 475, 1 October 2017, Pages 144-149
نویسندگان
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