Si: crys_iccge18Growth and electrical properties characterization of Pb(In1/2Nb1/2)O3-PbTiO3 tetragonal single crystal by the modified flux-Bridgman method

- PIN-PT single crystal was grown by the modified flux-Bridgman method.
- PIN-PT single crystal is in size of 35×20×20 mm3 for the first time.
- The composition segregation influences electrical properties and structure.
- PIN-PT single crystal possesses high Curie temperature and coercive field.

Pb(In1/2Nb1/2)O3-PbTiO3 (PIN-PT) single crystals with up to 35×20×20 mm3 were grown by the modified flux-Bridgman method under spontaneous nucleation for the first time. Phase structure of as-grown PIN-PT single crystal was tetragonal phase. From the bottom to top of crystal, PT content increases from 0.38 to 0.44 along growth direction. Curie temperature increased from 253.9 to 299.6 °C and εr at room temperature decreased from 5343 to 1219. Piezoelectric coefficient d33 decreased from 1129pC/N to 610pC/N. Coercive field increased from 8.13 kV/cm to 16.96 kV/cm. Vertical 90° and anti-parallel 180° tetragonal domain with size of 100 µm were observed by PLM (Polar-Light Microscope). The results indicate that Pb(In1/2Nb1/2)O3-PbTiO3 tetragonal single crystal has higher curie temperature, coercive field and lower piezoelectric constant than that of its rhombohedral crystal.