کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
598282 | 1454087 | 2006 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Spectroscopic ellipsometry on a novel cyanine dyes in Langmuir-Blodgett multilayers
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
شیمی کلوئیدی و سطحی
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چکیده انگلیسی
We have investigated on cyanine dye (HQ) in Langmuir-Blodgett (LB) films by spectroscopic ellipsometer (SE) and compared the results with that obtained by using small angle X-ray diffraction (SAXD). It is found from the isotherms that there is a critical point on Langmuir films near the area 0.8 nm2/molecule for HQ LB films with and without Cd2+ ions, respectively and suggested that the facts should result from the phase transition due to the change of molecular tilt angle on surface of sub-phase. The refractive indexes as a function of the wavelength λ are reported by the SE method using the three layers-model (air-LB film-silicon wafer) and Cauchy dispersion equation, for the first time presented in literature. The thickness of a single deposited layer is 2.45 nm on average. The thickness of per monolayer is agreement with those obtained by SAXD measurements.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Colloids and Surfaces A: Physicochemical and Engineering Aspects - Volumes 284â285, 15 August 2006, Pages 414-418
Journal: Colloids and Surfaces A: Physicochemical and Engineering Aspects - Volumes 284â285, 15 August 2006, Pages 414-418
نویسندگان
Chuang Wang, Shihong Ma, Hao Zeng, Jing Li, Liangyao Chen, Wencheng Wang, He Tian,