کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
598650 | 1454097 | 2006 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Observation of a nanometer size confined transient phenomenon at the gold STM tip interface under UV illumination
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
شیمی کلوئیدی و سطحی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Observation of a nanometer size confined transient phenomenon at the gold STM tip interface under UV illumination Observation of a nanometer size confined transient phenomenon at the gold STM tip interface under UV illumination](/preview/png/598650.png)
چکیده انگلیسی
In the development of a hybrid STM-SNOM apparatus, we studied the influence of the illumination on the tip-sample system. Classically, the only effect measurable should be a thermal expansion and a nano-sized mechanical displacement due to a tiny radiation pressure on the tip. However, we observed different kind of perturbations that we had difficulties to explain. We demonstrated that the phenomenon appears to be strongly related to the surface properties of the sample, so we believe that it is not a direct effect of the thermal expansion, nor mechanical movement induced by the irradiation. We describe here the nature of the phenomenon examined, we give details on the experimental condition and setup parameters and we attempt to rigorously discuss the result obtained showing relation to an electro-capacitive coupling of the system at the surface interface. We believe this observation may shed light on the proximity processes that occurs under the STM probe in the presence of light and improve the fundamental understanding of nano-sized interfaces.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Colloids and Surfaces A: Physicochemical and Engineering Aspects - Volume 273, Issues 1â3, 1 February 2006, Pages 189-192
Journal: Colloids and Surfaces A: Physicochemical and Engineering Aspects - Volume 273, Issues 1â3, 1 February 2006, Pages 189-192
نویسندگان
Ruggero Micheletto, Masatoshi Yokokawa, Yu Ding, Daitsuke Hobara, Takahashi Kakiuchi, Yoichi Kawakami,