کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
6607633 | 459530 | 2016 | 31 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
SIMULTANEOUS ATOMIC FORCE-SCANNING ELECTROCHEMICAL MICROSCOPY (AFM-SECM) IMAGING OF COPPER DISSOLUTION
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
مهندسی شیمی (عمومی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: SIMULTANEOUS ATOMIC FORCE-SCANNING ELECTROCHEMICAL MICROSCOPY (AFM-SECM) IMAGING OF COPPER DISSOLUTION SIMULTANEOUS ATOMIC FORCE-SCANNING ELECTROCHEMICAL MICROSCOPY (AFM-SECM) IMAGING OF COPPER DISSOLUTION](/preview/png/6607633.png)
چکیده انگلیسی
Combined atomic force-scanning electrochemical microscopy (AFM-SECM) has been explored for monitoring copper ions generated by dissolution of copper samples while recording induced changes in topography. Released Cu2+ ions were detected via reduction to metallic copper at the AFM tip-integrated electrode followed by subsequent re-dissolution in bulk solution by anodic stripping voltammetry. Copper crystals electrodeposited on gold substrates were used as model systems to demonstrate the laterally resolved analysis of topographical changes and the simultaneous measurement of localized cation release, which was anodically activated upon exposure to acidified chloride-containing solution. Finally, the potential of AFM-SECM for monitoring spatially resolved corrosion processes with sub-micrometer resolution was illustrated using a pure copper sample.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Electrochimica Acta - Volume 201, 20 May 2016, Pages 320-332
Journal: Electrochimica Acta - Volume 201, 20 May 2016, Pages 320-332
نویسندگان
J. Izquierdo, B.M. Fernández-Pérez, A. Eifert, R.M. Souto, C. Kranz,