Characterization of scandium and gallium in red mud with Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) and Electron Probe Micro-Analysis (EPMA)

Characterization of scandium and gallium in red mud with Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) and Electron Probe Micro-Analysis (EPMA)

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Minerals Engineering - Volume 119, April 2018, Pages 263-273

Zhaobo Liu, Yanbing Zong, Hongxu Li, Zihan Zhao,