High structural and optical quality of III-V-on-Si 1.2 nm-thick oxide-bonded hybrid interface

High structural and optical quality of III-V-on-Si 1.2 nm-thick oxide-bonded hybrid interface

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 192, 15 May 2018, Pages 25-29

A. Talneau, G. Beaudoin, D. Alamarguy, G. Patriarche,