Non-homogeneous conduction of conductive filaments in Ni/HfO2/Si resistive switching structures observed with CAFM

Non-homogeneous conduction of conductive filaments in Ni/HfO2/Si resistive switching structures observed with CAFM

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 147, 1 November 2015, Pages 335-338

S. Claramunt, Q. Wu, M. Maestro, M. Porti, M.B. Gonzalez, J. Martin-Martinez, F. Campabadal, M. Nafría,