Band offsets and electrical stability characterization of Zr-doped ZnO thin-film transistors with a Gd2O3 gate insulator

Band offsets and electrical stability characterization of Zr-doped ZnO thin-film transistors with a Gd2O3 gate insulator

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 118, 25 April 2014, Pages 20-24

Hsien-Chin Chiu, Hsiang-Chun Wang, Yi-Cheng Luo, Fan-Hsiu Huang, Hsuan-Ling Kao, Kuang-Po Hsueh,