A de-embedding technique for metallic nanowires in microwave characterization

- We characterize Al nanowires from 1 to 100 GHz using a coplanar waveguide platform.
- A de-embedding procedure is employed to extract the intrinsic RF response of the wire.
- The result is supported by a quasi-TEM circuit model and shows good agreement.
- We analyze the transmission line properties in relation to the change of line dimension.