کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
702006 891065 2011 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Characterization of crystallographic defects in homoepitaxial diamond films by synchrotron X-ray topography and cathodoluminescence
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Characterization of crystallographic defects in homoepitaxial diamond films by synchrotron X-ray topography and cathodoluminescence
چکیده انگلیسی

Crystallographic defects in a p-type homoepitaxial diamond film grown by microwave plasma-assisted chemical vapor deposition on a synthetic high-pressure high-temperature type-Ib (001) substrate were characterized by synchrotron radiation X-ray diffraction topography (XRT) and cathodoluminescence (CL). CL mapping indicated typical luminescent spots corresponding to the band-A emission around 420 nm. The band-A spots correspond to the spots observed by XRT for both diffraction vectors g = [044] and [404], and are considered to be mixed dislocations with a dislocation direction t = [001]. Typical dislocations in the film, such as edge and perfect 60° dislocations were determined by utilizing the relationship between the diffraction vector g, Burgers vector b, and the dislocation line vector t.

Research Highlights
► High density of dislocations (103 /cm2) are observed on homoepitaxially grown diamond film with low roughness surface.
► Typical dislocations such as edge, 60o and mixed dislocations are observed by synchrotron radiation X-ray topography and cathode luminescence.
► Band-A luminescence was confirmed at the position of mixed dislocations.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Diamond and Related Materials - Volume 20, Issue 4, April 2011, Pages 523–526
نویسندگان
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