کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7117602 1461364 2018 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Influence of Ge content on Cu2Zn(SnGe)Se4 physical properties deposited by sequential thermal evaporation technique
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Influence of Ge content on Cu2Zn(SnGe)Se4 physical properties deposited by sequential thermal evaporation technique
چکیده انگلیسی
In this research, we report the synthesis of Cu2Zn(SnGe)Se4 compound by sequential thermal evaporation technique as well as the influence of the germanium content on the electrical, optical, structural, morphological and chemical properties of this material. The order of the metallic stacks deposited on the coated molybdenum glass substrates was Cu/Sn/Cu/Zn/Ge. In order to obtain the Cu/(Zn+Sn) and Zn/Sn compositional ratios close to those considered as optimum, the thicknesses of Cu (3 nm)/Sn(248 nm)/Cu(105 nm)/Zn (174 nm) were kept constant and only the thickness of the Ge layer was varied between 10 nm and 50 nm. Subsequently, these stacks were heat treated in a selenium atmosphere to achieve crystallization of the compound. The incorporation of small amounts of germanium shows a growth in the grain size and a more compact surface morphology without modifying the optical properties.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science in Semiconductor Processing - Volume 83, 15 August 2018, Pages 96-101
نویسندگان
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