Improving carriers mobility in copper and iron-codoped CdO

Thin films of Fe and Cu-codoped CdO (CdO:Cu:Fe) with different Fe content and fixed Cu content were deposited in a high vacuum on glass and Si wafer substrates. These films were studied by X-ray fluorescence (XRF), X-ray diffraction (XED), optical spectroscopy, and dc-electrical measurements. The structural results show enhancement of film [1 1 1] orientation with Fe doping especially with 1.3%Fe film. Also, light doping with Fe improves the dc-conduction parameters of the CdO:Cu:Fe films so that the utmost enhancement of mobility (90.5 cm2/Vs) and conductivity (1470.6 S/cm) was found with 1.3 wt% Fe doping level. It was found that the variation in the bandgap is related to the variation in electron concentration that caused by Fe doping. For low Fe ion concentration (<1.3 wt% ), the bandgap varies according to the Moss-Burstein model.