کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
726912 892657 2013 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Study of small holes on monocrystalline silicon cut by WEDM
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Study of small holes on monocrystalline silicon cut by WEDM
چکیده انگلیسی

We studied and analyzed the phenomenon of small holes on the surface of monocrystalline silicon when cut by wire cut EDM. When power density of plasma in the discharge channel reaches a certain value, gasification holes will appear. The influence of small holes on heat transfer process when monocrystalline silicon machined by WEDM was also analyzed, results show that these small holes make the surface heat source change towards body heat source, so thermal stress damage will happen and crack propagation depth increases rapidly when monocrystalline silicon machined by EDM.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science in Semiconductor Processing - Volume 16, Issue 2, April 2013, Pages 385–389
نویسندگان
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